2021
DOI: 10.1088/1361-6501/ac0fa7
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A modified method for calibration of polarimetric components using polarizing interferometry

Abstract: Polarization interferometer technique has been developed for calibration of phase retardation elements such as quarter/half wave plate with known tolerance in each one. In addition, this technique is used to measure unknown retardation elements to identify its phase retardation. A polarizing beam splitter is placed after Sagnac interferometer to split the produced fringes into p and s polarization interferograms to be analyzed. The phase retardation measurements depend on two states, the reference state which … Show more

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Cited by 5 publications
(2 citation statements)
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“…The optical constants of steel and aluminum blocks were determined with the PHE-103 ellipsometer at wavelengths ranging from 250 nm to 1000 nm with a fixed incidence angle of 70 • [21]. It was achieved by measuring the ellipsometric parameters Δ, Ψ, which indicated the phase and amplitude shift in the light beam after it had been reflected from the surface of the test item [22]. These factors were needed to calculate the object's optical constants, such as the refractive index 𝑛 and extinction coefficient 𝑘 [23].…”
Section: Optical Test Methodsmentioning
confidence: 99%
“…The optical constants of steel and aluminum blocks were determined with the PHE-103 ellipsometer at wavelengths ranging from 250 nm to 1000 nm with a fixed incidence angle of 70 • [21]. It was achieved by measuring the ellipsometric parameters Δ, Ψ, which indicated the phase and amplitude shift in the light beam after it had been reflected from the surface of the test item [22]. These factors were needed to calculate the object's optical constants, such as the refractive index 𝑛 and extinction coefficient 𝑘 [23].…”
Section: Optical Test Methodsmentioning
confidence: 99%
“…This change occurs due to the nature of the material under test. The general ellipsometry equation is as follows [10]: 𝜌 = tan 𝜓 𝑒 𝑖Δ (1) where 𝜌 is the complex reflectance ratio, Ψ and Δ are the ellipsometric parameters, the change in amplitude and change in phase after reflection respectively.…”
Section: Introductionmentioning
confidence: 99%