A modification to the VCR dimplerspecimen platen for TEM sample preparation

A procedure to prepare cross‐sectional samples for TEM

“…This is done by first making concave recesses on both faces of the disk with a commercially available machine (Dimpler made by the VCR group, San Francisco, CA 94312). The dimple monitoring is facilitated by using a procedure described by Rivaud (1985). After grinding off a dimple to a certain depth with 1-pm diamond paste, it is convenient to invert the sense of the specimen platen rotation and so hasten the elimination of the 1-pm scratches during polishing.…”

Comparative study of ion milling techniques in cross‐sectional transmission electron microscope specimen preparation

“…Microscopy technique and technology has advanced such that practical applications of this method are now solely limited by specimen preparation. Since the development of the conventional methods of specimen preparation (Bravman and Sinclair, 1984; Marcus and Sheng, 19831, many modifications to the basic techniques have been explored (Benedict et al, 1990; Chang et al, 1987;Madden and Crafard, 1989; Rivaud, 1985). The purpose of this study is to examine two recent modifications which have been made to the final thinning step: ion milling.…”