1973
DOI: 10.1016/0039-6028(73)90389-0
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A model for the Auger electron spectroscopy of systems exhibiting layer growth, and its application to the deposition of silver on nickel

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Cited by 189 publications
(20 citation statements)
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“…The morphology of Ag/Ni(1 1 1) has been studied by AES and LEED [271][272][273][274][275][276], ARPES [115] and TOF-ICISS [267,277]. However, the obtained results show quite large incongruities: some authors observed a flat growth [265,275] up to a critical coverage of about 0.7 Ag ML, while in other works the growth process seems to be dependent on the growth temperature [267,272,278]. QMD simulations and LEED experiments [271] on the early stages of Ag growth on Ni(1 1 1) at RT indicate the (7 Â 7) reconstruction of the Ag overlayer.…”
Section: Sp Dispersionmentioning
confidence: 99%
“…The morphology of Ag/Ni(1 1 1) has been studied by AES and LEED [271][272][273][274][275][276], ARPES [115] and TOF-ICISS [267,277]. However, the obtained results show quite large incongruities: some authors observed a flat growth [265,275] up to a critical coverage of about 0.7 Ag ML, while in other works the growth process seems to be dependent on the growth temperature [267,272,278]. QMD simulations and LEED experiments [271] on the early stages of Ag growth on Ni(1 1 1) at RT indicate the (7 Â 7) reconstruction of the Ag overlayer.…”
Section: Sp Dispersionmentioning
confidence: 99%
“…From the shape of the curves, one can deduce the growth mode mechanism. 23 A logarithmic representation of the Auger Si_(92 eV) signal versus deposition time is given in Figure 1(b), where a nearly linear decay corresponding to an exponential attenuation of the substrate intensity is observed. This reveals a layer-by-layer growth mode for Mg at RT 24 where each break on the curves corresponds to a monolayer completion (highlighted by vertical lines on Figure 1 It is reasonable to assume that one Mg ML corresponds in Figure 1(a) to the first break observed on the Si and Mg signals after 21 s of deposition (as expected for a layer-bylayer growth mode).…”
mentioning
confidence: 99%
“…General nature of the linear relationship between p-p height, h, and coverage, Θ (0 < Θ < 1), was confirmed experimentally many times (e.g. [19][20][21][22][23][24][25][26][27]). The appropriate formulae may be written as…”
mentioning
confidence: 83%