2016
DOI: 10.1080/23302674.2016.1244302
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A mixed dispatching rule for semiconductor wafer fabrication

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Cited by 3 publications
(1 citation statement)
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“…Consequently, it is necessary to determine appropriate dispatching and order release rules while considering fab process information in accordance with the changes in the environment. Other literature showed that closed-loop and global scheduling rules resulted in the procurement of better performance than other commonly used rules such as UNIF (Uniform), CONTIME (Constant time), FIFO (First in first out), EDD (Earliest due date), CR (Critical ratio), LPT (Longest processing time), and SPT (Shortest processing time) [21][22][23][24].…”
Section: T E Dmentioning
confidence: 99%
“…Consequently, it is necessary to determine appropriate dispatching and order release rules while considering fab process information in accordance with the changes in the environment. Other literature showed that closed-loop and global scheduling rules resulted in the procurement of better performance than other commonly used rules such as UNIF (Uniform), CONTIME (Constant time), FIFO (First in first out), EDD (Earliest due date), CR (Critical ratio), LPT (Longest processing time), and SPT (Shortest processing time) [21][22][23][24].…”
Section: T E Dmentioning
confidence: 99%