A Miniaturized Broadband Multi-State Reflectometer Integrated on a Silicon MEMS Probe for Complex Permittivity Measurement of Biological Material

Kım, Kihyun; Kim, Namgon; Hwang, Seung-won; Kim, Yong-Kweon; Kwon, Youngwoo

doi:10.1109/tmtt.2013.2250992

Cited by 39 publications

(21 citation statements)

References 36 publications

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“…Several millimeter-wave VNA systems have been recently demonstrated in the literature [2], [3]. Furthermore, the increased operating frequencies of VNAs have enabled the realization of compact sensors that are used for the measurement of the complex permittivity of organic materials, examples of such systems have already been demonstrated in the literature [4]- [6].…”

mentioning

confidence: 99%

Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors

Nasr

Nehring

Aufinger

et al. 2014

IEEE Trans. Microwave Theory Techn.

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This work presents a single-and dual-port fully integrated millimeter-wave ultra-broadband vector network analyzer. Both circuits, realized in a commercial 0.35-m SiGe:C technology with an of 170/250 GHz, cover an octave frequency bandwidth between 50-100 GHz. The presented chips can be configured to measure complex scattering parameters of external devices or determine the permittivity of different materials using an integrated millimeter-wave dielectric sensor. Both devices are based on a heterodyne architecture that achieves a receiver dynamic range of 57-72.5 dB over the complete design frequency range. Two integrated frequency synthesizer modules are included in each chip that enable the generation of the required test and local-oscillator millimeter-wave signals. A measurement statistical phase error lower than 0.3 is achieved. Automated measurement of changes in the dielectric properties of different materials is demonstrated using the proposed systems. The single-and dual-port network analyzer chips have a current consumption of 600 and 700 mA, respectively, drawn from a single 3.3-V supply.Index Terms-Heterodyne, millimeter wave, permittivity sensor, reflectometer, spectroscopy, vector network analyzer (VNA).

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mentioning

confidence: 99%

Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors

Nasr

Nehring

Aufinger

et al. 2014

IEEE Trans. Microwave Theory Techn.

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“…The probe has been fabricated using Si MEMS technology, which facilitates miniaturization and integration. For permittivity measurement, a multi-state reflectometer (MSR) has been employed as a detection circuits and integrated on the detection probe platform [12]. Based on the work of [1] and [4], the integrated probe is designed to operate in a broadband frequency covering both 2 and 16 GHz.…”

Section: Active Integrated Probesmentioning

confidence: 99%

Microwave active integrated probes for biomedical applications

Kım

Kim

Hwang

et al. 2013

2013 Asia-Pacific Microwave Conference Proceedings (APMC)

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This paper introduces recently developed active integrated probes for biomedical applications. To realize broadband cancer detection and low-power cancer ablation, planar-type coaxial probes have been integrated with active circuits for measurement and microwave generation, respectively. A multi-state reflectometer (MSR) is employed for cancer detection based on broadband permittivity characteristics. Also, to achieve microwave hyperthermia, a Kuband microwave source is integrated on the probe platform. Each active integrated probe is implemented on a single silicon platform using Microelectromechanical Systems (MEMS) and monolithic microwave integrated circuit (MMIC) technologies for miniaturization and integration. Through the experiments, the feasibilities of the active integrated probes for microwave cancer detection and ablation have been validated.Index Terms -Active probe, complex permittivity, hyperthermia, microelectromechanical systems (MEMS), multistate reflectometer, open-ended coaxial probe.

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“…Hence, they are easy to integrate and are adequate for high frequencies [4], [5]. Due to these advantages multiport measurement systems found a wide range of application from radars [6] or microwave receivers [7], [8] to systems for material properties monitoring [9], [10].…”

Section: Introductionmentioning

confidence: 99%

Investigation on Optimum Parameters of Six-Port Reflectometers

Staszek¹

2019

IJIEE

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In this paper a general investigation on the uncertainty of reflection coefficient measurements with the use of six-port reflectometer is presented. A wide range of both power measurement uncertainty and limited dynamics of the power meters utilized in the six-port systems are incorporated. Based on the conducted analysis the optimum parameters of six-port reflectometer are derived, which provide the lowest possible measurement uncertainty distribution for all reflection coefficients of passive devices.  Index Terms-Multiport measurement technique, six-port reflectometer, reflection coefficient, measurement uncertainty, power meters, dynamics of power range. Kamil Staszek received the M.Sc. and Ph.D. degrees in electronics engineering from the AGH

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A Miniaturized Broadband Multi-State Reflectometer Integrated on a Silicon MEMS Probe for Complex Permittivity Measurement of Biological Material

Cited by 39 publications

References 36 publications

Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors

Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors

Microwave active integrated probes for biomedical applications

Investigation on Optimum Parameters of Six-Port Reflectometers

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