Investigation on Optimum Parameters of Six-Port Reflectometers

Abstract

In this paper a general investigation on the uncertainty of reflection coefficient measurements with the use of six-port reflectometer is presented. A wide range of both power measurement uncertainty and limited dynamics of the power meters utilized in the six-port systems are incorporated. Based on the conducted analysis the optimum parameters of six-port reflectometer are derived, which provide the lowest possible measurement uncertainty distribution for all reflection coefficients of passive devices.  Index Terms-Multiport measurement technique, six-port reflectometer, reflection coefficient, measurement uncertainty, power meters, dynamics of power range. Kamil Staszek received the M.Sc. and Ph.D. degrees in electronics engineering from the AGH

A Novel Investigation Method for the S21 Detection Circuit

“…Scattering parameters (S-parameters) [1][2] are frequently used to characterize the circuit performance in the field of radio frequency (RF). To reduce the costs of testing RF integrated circuits (ICs) with commercial vector network analyzers (VNAs), implementing on-chip S-parameter measurement is one promising research direction [3][4][5][6][7][8][9][10]. Jayaraman [3], Goyal [4], Wu [5], and Howard [6] demonstrated how to exploit the concept of the on-chip measurement to perform self-healing adjustments on RF circuits.…”

“…Nehring [7] and Niitsu [8] illustrated the possibilities of applying the embedded S-parameter measurement to the field of biomedicine. Philippe [9] and Staszek [10] employed the theory of the six-port reflectometer to execute S-parameter measurement. To implement the on-chip measurement of the transmission coefficient (S 21 ) of a two-port device under test (DUT) with a simple circuit, the S 21 detection circuit was proposed in [11].…”