2001
DOI: 10.1016/s0924-4247(00)00547-1
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A method to evade silicon backside damage in deep reactive ion etching for anodically bonded glass–silicon structures

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Cited by 9 publications
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“…However, such processing can cause variations by as much as 10 µm [ 14 , 15 , 16 ], which is unsuitable when the required precision is on the order of microns. One option for processing that can be realized with high precision and a high aspect ratio is deep reactive ion etching (DRIE) of silicon [ 17 , 18 , 19 , 20 ], used in anisotropic processing. DRIE is widely employed for producing dynamic random-access memories (DRAMs) and other devices.…”
Section: Introductionmentioning
confidence: 99%
“…However, such processing can cause variations by as much as 10 µm [ 14 , 15 , 16 ], which is unsuitable when the required precision is on the order of microns. One option for processing that can be realized with high precision and a high aspect ratio is deep reactive ion etching (DRIE) of silicon [ 17 , 18 , 19 , 20 ], used in anisotropic processing. DRIE is widely employed for producing dynamic random-access memories (DRAMs) and other devices.…”
Section: Introductionmentioning
confidence: 99%