2019
DOI: 10.1541/ieejjia.8.306
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A Method of Junction Temperature Estimation for SiC Power MOSFETs via Turn-on Saturation Current Measurement

Abstract: Maintaining the operating junction temperature of a SiC Power MOSFET within a safe and tolerable range is crucial not only for safety reasons, but also for reliable operation, as thermal transient is one of the major stressors that threaten a device's life span. Conventional methods use thermal sensors for temperature monitoring. However, these sensors require extra space, and the measurement accuracy is affected by their position. Besides, they are unable to track the transient temperature variation owing to … Show more

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Cited by 16 publications
(4 citation statements)
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References 13 publications
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“…15 shows the estimated peak junction temperature of the MOSFETs for each short-circuit duration. Direct measurement of the junction temperature poses a challenge due to the short duration of the short circuit, typically lasting only several-µs [35]- [37]. In Fig.…”
Section: Experimental Verificationmentioning
confidence: 99%
“…15 shows the estimated peak junction temperature of the MOSFETs for each short-circuit duration. Direct measurement of the junction temperature poses a challenge due to the short duration of the short circuit, typically lasting only several-µs [35]- [37]. In Fig.…”
Section: Experimental Verificationmentioning
confidence: 99%
“…2) Small size for neater integration: One main motivation to increase switching speed with WBG devices is to reduce the sizes of passive components. The final converter can then be less costly with a much higher power density [13], [14]. Consequently, its integrated current sensors must be miniaturized too without compromising sensing accuracy and reliability [10], [15].…”
Section: Introductionmentioning
confidence: 99%
“…Such devices make the circuit possible to operate at a higher switching frequency compared with the use of conventional devices. This allows an increase of power density, by reducing the size of the passive elements [1], [2].…”
Section: Introductionmentioning
confidence: 99%