A method for fast simulation of multiple catastrophic faults in analogue circuits

Tadeusiewicz, M.; Hałgas, Stanisław

doi:10.1002/cta.570

Cited by 9 publications

(11 citation statements)

References 28 publications

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“…Sensitivity analysis of the amplifier small signal model is made for frequency f 0 = 1.5 GHz. There are known scattering parameters s 11 , s 12 , s 21 , s 22 of the transistors measured in grounded emitter configuration [5]-it is assumed, for simplicity, that both transistors are described by the same set of parameters. Analysis is performed using the modified nodal algorithm which is possible because scattering parameters of transistors are converted into admittance parameters y 11 , y 12 , y 21 , y 22 .…”

Section: Example-linear Circuitmentioning

confidence: 99%

High‐order sensitivity invariants

Izydorczyk

Chojcan

2010

Circuit Theory & Apps

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SUMMARYThe aim of the research reported in this paper is to extend the notion of invariant sensitivity sum, widely known for electrical networks, from first-order sensitivities to high-order sensitivities. The results are high-order invariant sums of sensitivities of the first and the second kind, formulated for nonlinear lumped circuit, which consists of one-port and two-ports only. One-ports are generalized resistances, capacitances, inductances, voltages, and current sources, whereas two-ports are nonlinear generalizations of four types of controlled sources. It is observed that the invariant sums actually found for nonlinear lumped networks are generalizations of sums given earlier by authors for linear lumped networks. The article is illustrated by numerical sensitivity analysis of simple linear and nonlinear circuits.

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Section: Example-linear Circuitmentioning

confidence: 99%

High‐order sensitivity invariants

Izydorczyk

Chojcan

2010

Circuit Theory & Apps

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“…By comparing some quantities, obtained on the basis of measurement, with the patterns contained in the dictionary the fault can be located and identified. During the last decades many tools have been used to build and exploit fault dictionary, e.g., sensitivity analysis [14], neural networks [1,2], and the Householder formula in matrix theory [22].…”

Section: Introductionmentioning

confidence: 99%

Spot Defect Diagnosis in Analog Nonlinear Circuits with Possible Multiple Operating Points

2015

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The paper is focused on local spot defect diagnosis in nonlinear analog integrated circuits. The defects are simulated by finite resistors, high in the case of open and low in the case of short. A diagnostic method that allows detecting, locating, and estimating the value of the defect is developed. The method employs the simulation before test approach leading to a fault dictionary and brings a procedure for locating the defect and estimating its value, on the basis of some quantities measured during the diagnostic test. Because the nonlinear circuit under test may have multiple operating points, even if the fault-free circuit has a unique solution, building the fault dictionary requires a special approach. It is based on some families of characteristics, expressing the resistances that simulate the defects in terms of several voltages, taking into account the deviations of the fault-free parameters within their tolerance ranges. To illustrate the proposed approach two numerical examples are given.

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“…Analogue circuit testing and diagnosing are necessary to achieve high quality and reliability of analogue systems and to control their production yield [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. The diversity of analogue signals, noise presence, the limited accuracy of test measurements, circuit parameters' tolerance dispersions and simulation models inaccuracies are exemplary difficulties which are reasons of the complexity of analogue circuit testing [1].…”

Section: Introductionmentioning

confidence: 99%

Stimulus with Limited Band Optimization for Analogue Circuit Testing

Golonek¹,

Jantos²,

Rutkowski³

2012

Metrology and Measurement Systems

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The paper presents an analogue circuit testing method that engages the analysis of the time response to a nonperiodic stimulus specialized for the verification of selected specifications. The decision about the current circuit diagnostic state depends on an amplitude spectrum decomposition of the time response measured during the test. A shape of the test excitation spectrum is optimized with the use of a differential evolution algorithm and it allows for achieving maximum fault coverage and the optimal conditions for fault isolation. Genotypes of the evolutionary system encode the amplitude spectrum of candidates for testing stimuli by means of rectangle frequency windows with amplitudes determined evolutionarily.

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A method for fast simulation of multiple catastrophic faults in analogue circuits

Cited by 9 publications

References 28 publications

High‐order sensitivity invariants

High‐order sensitivity invariants

Spot Defect Diagnosis in Analog Nonlinear Circuits with Possible Multiple Operating Points

Stimulus with Limited Band Optimization for Analogue Circuit Testing

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