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2015
DOI: 10.1016/j.jnoncrysol.2015.07.025
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A method for diffraction-based identification of amorphous sp 2 carbon materials

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Cited by 6 publications
(14 citation statements)
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References 16 publications
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“…In [5], we found that the fraction of carbon atoms, which belong to the intact C 60 fullerenes, in the total number of carbon atoms (we excluded the contribution of gas impurities of N, O and H from our quantitative analysis) in the S 25 and S 600 samples is equal to 59 % and 49 %, respectively. For the samples annealed at high temperatures, this fraction is significantly lower.…”
Section: Sensitivity Of Characterization To Domain-like Packing Of Namentioning
confidence: 99%
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“…In [5], we found that the fraction of carbon atoms, which belong to the intact C 60 fullerenes, in the total number of carbon atoms (we excluded the contribution of gas impurities of N, O and H from our quantitative analysis) in the S 25 and S 600 samples is equal to 59 % and 49 %, respectively. For the samples annealed at high temperatures, this fraction is significantly lower.…”
Section: Sensitivity Of Characterization To Domain-like Packing Of Namentioning
confidence: 99%
“…In [5], we suggested a method for estimating the structural properties of amorphous sp 2 carbon and applied it to the samples studied in [1]. This method enabled us to quantify the Diffraction-based characterization of amorphous sp 2 carbon... 227 structural properties of the samples in terms of the average size and curvature of the sp 2 carbon structures (graphene-like flakes of 14 -285 carbon atoms) as well as to estimate the fraction of the intact C 60 fullerenes in the samples for each annealing temperature.…”
Section: Introductionmentioning
confidence: 99%
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