2014
DOI: 10.1117/12.2069711
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A method for compensating the polarization aberration of projection optics in immersion lithography

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Cited by 4 publications
(2 citation statements)
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“…In addition, because of low K 1 and ultrahigh NA, the simplified thin mask mode become inaccurate for lithography performance analysis [4][5][6] . The mechanism, such as large incident angle, film coatings and lens material intrinsic birefringence could induce the PA, making adverse effect on image performance [7][8] . Several representations of PA have been proposed, such as Jones pupil, physical pupil, Mueller pupil ,Pauli pupil and 3D PA [9][10][11][12][13][14] .…”
Section: Introductionmentioning
confidence: 99%
“…In addition, because of low K 1 and ultrahigh NA, the simplified thin mask mode become inaccurate for lithography performance analysis [4][5][6] . The mechanism, such as large incident angle, film coatings and lens material intrinsic birefringence could induce the PA, making adverse effect on image performance [7][8] . Several representations of PA have been proposed, such as Jones pupil, physical pupil, Mueller pupil ,Pauli pupil and 3D PA [9][10][11][12][13][14] .…”
Section: Introductionmentioning
confidence: 99%
“…A lithography process in the semiconductor industry, for example, relies on the quality of its optical system [6][7][8][9]. Reducing the feature size of a microchip from 42 to 10 nm using the ultraviolet lithography technique requires that the key optical element of the lithography system needs a flatness of 2 nm across an area of 30 cm [10].…”
Section: Introductionmentioning
confidence: 99%