2018
DOI: 10.1088/1361-6528/aacf50
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A mechanical system for tensile testing of supported films at the nanoscale

Abstract: Standard tensile tests of materials are usually performed on freestanding specimens. However, such requirement is difficult to implement when the materials of interest are of nanoscopic dimensions due to problems related to their handling and manipulation. In the present paper, a new device is presented for tensile testing of thin nanomaterials, which allows tests to be carried out on specimens initially deposited onto a macroscopic pre-notched substrate. On loading, however, no substrate effects are introduce… Show more

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Cited by 13 publications
(13 citation statements)
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References 39 publications
(40 reference statements)
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“…As a matter of fact, it is rare to find in the literature experimental stress-strain curves of nanoscale materials showing a steep softening branch. One example can be found in Pantano et al (2018), where the stress-strain curve of a poly(methyl methacrylate) (PMMA) film with about 100 nm thickness shows a final softening region with negative slope of ∼-736 N/m. This value approaches (yet is still below) the limit of the load sensor stability region, whose upper bound corresponds to the load sensor stiffness (831 N/m in this case).…”
Section: Analysis Of Results and Discussionmentioning
confidence: 99%
“…As a matter of fact, it is rare to find in the literature experimental stress-strain curves of nanoscale materials showing a steep softening branch. One example can be found in Pantano et al (2018), where the stress-strain curve of a poly(methyl methacrylate) (PMMA) film with about 100 nm thickness shows a final softening region with negative slope of ∼-736 N/m. This value approaches (yet is still below) the limit of the load sensor stability region, whose upper bound corresponds to the load sensor stiffness (831 N/m in this case).…”
Section: Analysis Of Results and Discussionmentioning
confidence: 99%
“…The ultimate tensile strength was measured using a modified method. 46 A 30 nm thick layer of titanium was deposited onto a curved glass by PVD to increase the conductivity for SEM characterization. The surface roughness of the substrates was measured by an atomic force microscope (Dimension 3100, Veeco).…”
Section: Methodsmentioning
confidence: 99%
“…The air speed was measured by an InFlux flow meter. The ultimate tensile strength was measured using a modified method . A 30 nm thick layer of titanium was deposited onto a curved glass by PVD to increase the conductivity for SEM characterization.…”
Section: Methodsmentioning
confidence: 99%
“…displays [15]. In many cases a strong interaction with the substrate is required, at least at specific locations, as to securely clamp the edge of a freestanding nanoscale resonator [16] or the boundary of a membrane for mechanical tests [17], [18], [19], [20], [21] or to induce strain through a flexible substrate in order to investigate strain engineering properties [22]; whereas in many others the interaction should be as low as possible, as in electro-mechanical switches, or of medium intensity, in order to have well-adhered but sliding graphene flakes able to fold in nanoribbons [23].…”
Section: Accepted Manuscriptmentioning
confidence: 99%