2007
DOI: 10.1134/s1063782607030141
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A mathematical simulation of the effect of the bistability of current characteristics in nanosized multiple-layer heavily doped heterostructures

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Cited by 4 publications
(5 citation statements)
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“…5, dashed line). 1 Note that, on the VCC segment with NDI, the ratio between currents j and j 1 will be rather small (j/j 1 Ӷ 1). 3 3…”
Section: Physical Processes In Electron Devicesmentioning
confidence: 99%
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“…5, dashed line). 1 Note that, on the VCC segment with NDI, the ratio between currents j and j 1 will be rather small (j/j 1 Ӷ 1). 3 3…”
Section: Physical Processes In Electron Devicesmentioning
confidence: 99%
“…To this end, at first sight, it would be sufficient to simply introduce the corresponding time derivatives into the system of fundamental equations for the high field electron drift used in [1,2]. However, the extremely high laboriousness of this direct approach to the construction of algorithms and their software implementation impelled us to search for a simpler and practical method for estimating the corresponding transient processes.…”
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confidence: 98%
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