2021
DOI: 10.1016/j.mencom.2021.09.045
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A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films

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Cited by 3 publications
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“…This may indicate that MoS 2 prevents the formation of MoSe 2 . A similar obstacle to the formation of the MoSe 2 layer due to the MoS 2 layer was established in other works during the synthesis of Cu 2 ZnSn(S,Se) 4 thin films by the selenization of deposited Cu/Sn/ZnS precursors by magnetron sputtering on glass/Mo substrates [34,35].…”
Section: X-ray Analysis Of Thin Filmssupporting
confidence: 65%
“…This may indicate that MoS 2 prevents the formation of MoSe 2 . A similar obstacle to the formation of the MoSe 2 layer due to the MoS 2 layer was established in other works during the synthesis of Cu 2 ZnSn(S,Se) 4 thin films by the selenization of deposited Cu/Sn/ZnS precursors by magnetron sputtering on glass/Mo substrates [34,35].…”
Section: X-ray Analysis Of Thin Filmssupporting
confidence: 65%