A Low Power Soft Error Hardened Latch with Schmitt-Trigger-Based C-Element

SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments

“…In the last decade, researchers have proposed many radiation hardened circuits, such as flip-flops [5][6], random-access-memory cells [7][8][9], and latches [10][11][12][13][14][15][16][17][18][19][20][21], to tolerate SNUs, DNUs and even TNUs. This paper mainly considers hardness for latch designs.…”

“…This paper mainly considers hardness for latch designs. Typical SNUs, DNUs and/or TNUs hardened latch designs include the SHC [10], LSEHv1 [11], RFC [12], LSEDUT [13], DeltaDICE [14], HRDNUT [15], HREETNU [16], TNUHL [17], TNURL [18] and LCTNURL [4]. However, these latch designs still suffer from severe limitations as described below.…”