A long period time-to-pulse height converter and new calibration methods

Glatz, J.F.C.

doi:10.1016/0029-554x(70)90150-3

Nuclear Instruments and Methods

1970

DOI: 10.1016/0029-554x(70)90150-3

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A long period time-to-pulse height converter and new calibration methods

J.F.C. Glatz

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1974

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Cited by 14 publications

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Half lives of the 482.2 keV and 615.3 keV levels in181Ta

Mouchel

Hansen

1984

Z Physik A

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The half lives of the excited levels at 482.2keV and 615.3keV in 181Ta have been measured by the delayed coincidence technique. In the nanosecond time range (482.2 keV level) the most serious sources of errors are jitter, walk and drift phenomena. To minimize those the time pick-off has been defined carefully by means of modern fast timing detectors and electronics. In the microsecond time range (615.3 keV level) the ratio of true delayed coincidences to chance coincidences influences considerably the final accuracy of the half-life measurements. It has been reduced as much as possible.From a series of independent measurements half lives of T1/2=(10.67 _+0.05)ns and T1/2 =(17.64_+0.14)ps have been deduced for the 482.2keV and 615.3keV levels, respectively. The results have been compared with other values published before.

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Half lives of the 482.2 keV and 615.3 keV levels in181Ta

Mouchel

Hansen

1984

Z Physik A

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Half-life measurements of excited levels in the nanosecond and microsecond region

Mouchel

Hansen

1983

The International Journal of Applied Radiation and Isotopes

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The logic design of high precision time-to-pulse-height converters

Bertolaccini¹,

Cova²

1974

Nuclear Instruments and Methods

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A long period time-to-pulse height converter and new calibration methods

Cited by 14 publications

References 4 publications

Half lives of the 482.2 keV and 615.3 keV levels in181Ta

Half lives of the 482.2 keV and 615.3 keV levels in181Ta

Half-life measurements of excited levels in the nanosecond and microsecond region

The logic design of high precision time-to-pulse-height converters

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