A high-precision current measurement platform applied for statistical measurement of discharge current transient spectroscopy of traps in SiN dielectrics
Abstract:This paper presents a current measurement platform to measure current across dielectrics with a high-precision of 10−17 A from a large number of small capacitors at high speed. The developed platform consists of a common readout circuit part and a dielectric part formed on the circuit part by a simple process. A platform chip with 10 μm pitch 384H × 360V cells was fabricated using a 0.18 μm CMOS technology and silicon nitride (SiN) films were formed by plasma-enhanced CVD (PECVD) as a measurement target. The t… Show more
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