A High Directivity, Broadband Coaxial Coupler (Correspondence)

Hudson, P.A.

doi:10.1109/tmtt.1966.1126253

Cited by 12 publications

(1 citation statement)

References 3 publications

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“…One of the reported size reduction techniques is the combination of lumped and distributed elements, leading to a semi‐lumped approach. The advantage of the semi‐lumped approach compared to the distribute approach is obviously the filter miniaturization . Also, various type of low‐pass filters using semi‐lumped topologies, such as semi‐lumped low temperature co‐fired ceramic (LTCC) low‐pass filter and semi‐lumped low‐pass filter fabricated with standard air bridge, are investigated recently.…”

Section: Introductionmentioning

confidence: 99%

Design and implementation of a practical semi-lumped high power low-pass filter

Pourgholamhossein

Askari

Hedayati

et al. 2014

Int J RF and Microwave Comp Aid Eng

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In this article, a compact, semi-lumped and high power low-pass filter in VHF band frequency is designed, fabricated, and measured. A semi-lumped structure is used to decrease the size of the filter and improve its power handling. In high power analysis, all effects of critical points in distributed and lumped structures are considered. The experimental measurements show close agreement with the simulation results. This filter has a cut off frequency at 180 MHz, 0.02 dB ripples in pass band, return loss better than 21 dB in the pass band, 0.2 dB insertion losses, 1.6 dB/MHz shape factor, a 75% miniaturization against conventional structures with distributed elements, and wide out of band rejection. Moreover, 10 and 1 KW are the peak power and the average power handling of the filter. V C 2014 Wiley Periodicals, Inc. Int J RF and Microwave CAE 24:605-614, 2014.

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Section: Introductionmentioning

confidence: 99%

Design and implementation of a practical semi-lumped high power low-pass filter

Pourgholamhossein

Askari

Hedayati

et al. 2014

Int J RF and Microwave Comp Aid Eng

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Zur Abbildung von Isolierschichtdefekten im Elektronenspiegelmikroskop

Weidner¹,

Weißmantel²,

Herberger³

et al. 1975

Cryst Res and Technol

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Anknupfcnd a n Untersuchungeii z u m Ahbildniigsverhalttri von homogenrm Isolatorschichten werdcii t'bcrlegiingcxi jzur Abhildung voii Schichtiiihomogeriitateri angestvllt, die pine Kont,rastverst,~rliiiiig diirch Aufladixngscrscheinringcri erwarteri lasscri. Dwch defiiiic.rtc M'ahl des Uritcrlagenpotrntirtls ist eine Unterscheidiing gcometrischer Schichtdefelctc (Erbeburigen, Verticfiingcii, Locher) und elektrischer Iiiliornogeiiitat,eii der Isolicrschicht (Bereiche erhoht,cr bziv. Trcrmindrrtcr Leitfiihigkeit) moglich, n i e die experiinentcllcn Untersiichungcri zeigcri. Unterscl-ieiduiigsmerl~m~~lr, fiir die einzelnc~i Piillo lassen sich angebeii. Es zeigt sich, dnD die ~arhu.eisempfindlichlrrit fur die Erfitssiing vnn Tnfiornogenit.Sit,cii in uribcdeckten Isolatorschicht,en grol3or 1st.. a,ls hri tier Uiit~ttrsiichiing leitfdhig hedeckter Schichten.Following the investigat>ions on the imaging beharionr of hornopcncoiis tlic,lrctric layrrs considerations on the pomibilitics of imaging simple layer inhomogcneitics are discBiisscd.corisideratioris imply a cniitittst amp1if:catiori by charging phtmomcria. By definite variatioii of t h r siibst,ret,c potential a dist.iiictitrii'bct,wctn ge~metrical laycr defects (protriisioris, iiitlcrit,atioiis, holes) aiid clcctricd irihomogciieities of tlir insiiluting lq7cr (wpioiis of iricLrcxased aiid clccreascci conductivity. resp.) is ~o~s i b I c * as ~l i o u i i by the rxperiniviitrtl irivcstigatioris.Critcrions for distinguishing diffrrerit cases c a n be givcii. The ~eiisitivity for tletc,ctiiig iiihomogcrieities in non-covered diclcctric layers is higher than in the case of tliosc Iicirig covered with a coriductivc: laycr.

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Impedanzmessung

Groll¹

1969

Mikrowellenmesstechnik

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A High Directivity, Broadband Coaxial Coupler (Correspondence)

Cited by 12 publications

References 3 publications

Design and implementation of a practical semi-lumped high power low-pass filter

Design and implementation of a practical semi-lumped high power low-pass filter

Zur Abbildung von Isolierschichtdefekten im Elektronenspiegelmikroskop

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