A heuristic fault based optimization approach to reduce test vectors count in VLSI testing

Khera, Vinod Kumar; Sharma, Ramesh Kumar; Gupta, Anu

doi:10.1016/j.jksuci.2017.02.001

Cited by 7 publications

(3 citation statements)

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“…According to Equation ( 17), PMTV contains 13 undetermined parameters β; these parameters can be determined by fitting F(i), for F(i) includes the P MTV i of the sub-matrix MTV i itself and the estimated impact on P MTV . For each MTV, this paper will calculate its P MTV as well as P MTV n−i of its sub-matrix MTV n−i , so that we can obtain the objective function G(i) that is shown as Equation (18).…”

Section: Parameter Determination Methods Of Heuristic Function Based ...mentioning

confidence: 99%

“…Ref. [18] presents a method for optimizing test vectors based on fault information using the idea of heuristic. Ref.…”

Section: Introductionmentioning

confidence: 99%

“…1 0.00 6.37 8.56 6.68 7.98 3.13 5.98 5 18. 5.49 2.86 3.24 3.27 5.56 5.89 8.55 5.67 7.66 5.78 6.61 7.92 2 6.37 0.00 4.74 8.15 5.97 1.17 4.88 9.60 4.21 5.33 3.76 8.08 6.63 6.47 7.29 7.24 4.83 3.24 3.15 1.85 3 8.56 4.74 0.00 3.76 7.76 3.72 5.21 5.75 1.50 6.28 5.89 5.36 3.85 4.65 7.37 6.54 2.73 4.47 0.55 6.37 4 6.68 8.15 3.76 0.00 3.47 5.42 6.55 1.89 3.36 6.94 4.13 3.43 3.30 2.43 6.15 3.56 6.09 5.19 9.64 7.08 5 7.98 5.97 7.76 3.47 0.00 6.14 4.08 2.85 3.28 3.95 2.16 4.58 1.65 4.59 5.04 5.60 8.75 6.90 5.07 8.08 6 3.13 1.17 3.72 5.42 6.14 0.00 1.88 3.57 3.85 4.98 5.10 4.29 5.68 8.11 4.20 7.97 9.31 4.46 2.96 5.08 7 5.98 4.88 5.21 6.55 4.08 1.88 0.00 1.08 5.98 3.85 4.46 4.73 4.18 3.90 3.10 0.67 4.09 8.17 4.23 2.83 8 5.18 9.60 5.75 1.89 2.85 3.57 1.08 0.00 6.78 5.09 5.99 1.53 7.02 3.49 5.04 5.80 9.94 6.32 7.59 8.55…”

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A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model

Su,

Guo,

Luo

et al. 2024

Applied Sciences

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The generation of test vectors is a key technique that affects the efficiency and fault detection rate of the boundary scan test. Aiming at the local optimal solution problem of the current common test vectors generation algorithm, this paper proposes a test vectors generation algorithm based on improved GA-AO* model, through which the test vectors are generated by using the idea of heuristic search and backtracking correction. In order to speed up the heuristic search, this paper designed a heuristic function with both prior and posterior parameters to describe the influence of typical faults on the failure probability index of the test vectors. At the same time, this paper used a genetic algorithm (GA) to determine the specific values of the posterior parameters iteratively. Finally, through theoretical analysis and physical verification, compared with the test vector generated by the traditional method, the test vector generated by this method is optimized on the prior failure probability index and performs better in the physical experiment.

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Section: Parameter Determination Methods Of Heuristic Function Based ...mentioning

confidence: 99%

“…Ref. [18] presents a method for optimizing test vectors based on fault information using the idea of heuristic. Ref.…”

Section: Introductionmentioning

confidence: 99%

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