2004
DOI: 10.1002/mop.20252
|View full text |Cite
|
Sign up to set email alerts
|

A focused‐beam methodology for measuring microwave backscatter

Abstract: A methodology is developed to determine the microwave backscatter from inhomogeneous materials and structures using a free‐space focused‐beam apparatus. This quantitative method determines the scattering coefficient for inhomogeneous surfaces and echo width for linear discontinuities. Measured data from a random rough surface are compared to compact radar cross‐section (RCS) range measurements, scatter data from a periodic array are compared to numerical simulations, and edge‐diffraction measurements are compa… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
14
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 11 publications
(17 citation statements)
references
References 4 publications
0
14
0
Order By: Relevance
“…assuming a symmetric S matrix and noting that μ ≈ μ 0 at all frequencies for the dielectric polymers in this study, so derivatives with respect to permeability vanish (Schultz 2012). Complex permittivity values obtained through 2-port S-parameter analysis using a transmission-based ( S 21 and S 12 ) algorithm, collected at 0 dBm (1 mW) output power and a frequency step size of Δf = 15 MHz, are presented in Fig.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…assuming a symmetric S matrix and noting that μ ≈ μ 0 at all frequencies for the dielectric polymers in this study, so derivatives with respect to permeability vanish (Schultz 2012). Complex permittivity values obtained through 2-port S-parameter analysis using a transmission-based ( S 21 and S 12 ) algorithm, collected at 0 dBm (1 mW) output power and a frequency step size of Δf = 15 MHz, are presented in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…5 provides a measure of the fraction of beam power absorbed in the sample plates. The calibration does not fully address the potential sources of error in the permittivity measurements, which include phase error contributions from geometric uncertainty associated with the on-axis positioning and thickness of the sample plates, in addition to inherent uncertainties associated with the design of the focused beam system (Schultz 2012). Relative uncertainty of measured permittivity values for each sample type were calculated from 10 successive cycles of S-parameter and EM property extractions, with a full unmounting and remounting of the sample between each iteration.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Substrate geometry was coated with 50 nanometers thin gold (Au) layer by the process of optical lithography then a layer of 4 micrometers thin Ni was grown electrochemically and selective removal of gold form this layer takes place. In 2013 Trong N. Duong, Jayanti Venkatarama and Zhaolin Lu presented paper on Nanoplasmonics metamaterial "Enhancement of Ambient Energy Haresting Using a Metamaterial Lens" [14]. This paper is based on harvesting of Radio frequency energy by Metamaterial lens.…”
Section: Metamaterialsmentioning
confidence: 99%
“…The frequencies of the measurements are within the X-band range (from 8.2 to 12.4 GHz). The focused beam horn antenna was selected to minimize the effects of the experimental circumstances [ 17 ]. The 1-port calibration method for the focused beam environment with reflectors in several positions was proposed to improve the accuracy of the measured reflections.…”
Section: Introductionmentioning
confidence: 99%