2013 IEEE International Electron Devices Meeting 2013
DOI: 10.1109/iedm.2013.6724606
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A flexible ultra-thin-body SOI single-photon avalanche diode

Abstract: The world's first flexible ultra-thin-body SOI single-photon avalanche diode (SPAD) is reported with peak photon detection probability (PDP) at 11%, dark count rate (DCR) around 20kHz and negligible afterpulsing and cross-talk. It compares favorably with CMOS SPADs while it can be bended to 10mm-diameter and operate both in frontside-(FSI) and backside-illumination (BSI).

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Cited by 6 publications
(9 citation statements)
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References 8 publications
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“…Thanks to the buffering circuits, the dead time, which depends on RC recharge time in a passive quenching scheme, was reduced to around 160ns and consequently the PDP was enhanced because of the increased saturation frequency, which determines the upper limit of photon flux detectability. Furthermore, compared with our previous work [13], the PDP performance of BSI SPADs was also improved. The main reason is the epitaxy body doping diffusion into the intrinsic silicon layer on top of the buried oxide layer (Fig.…”
Section: Characteristics On Flexible Cmos Spad Sensor Pixelmentioning
confidence: 65%
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“…Thanks to the buffering circuits, the dead time, which depends on RC recharge time in a passive quenching scheme, was reduced to around 160ns and consequently the PDP was enhanced because of the increased saturation frequency, which determines the upper limit of photon flux detectability. Furthermore, compared with our previous work [13], the PDP performance of BSI SPADs was also improved. The main reason is the epitaxy body doping diffusion into the intrinsic silicon layer on top of the buried oxide layer (Fig.…”
Section: Characteristics On Flexible Cmos Spad Sensor Pixelmentioning
confidence: 65%
“…1(a), a P + enhancement region is made to form the multiplication region, where the electric field is concentrated in this planar region and higher than that around the curvature region of the junction, thus preventing premature edge breakdown [18,19]. It has been confirmed by DCR versus temperature measurements [13] that a large portion of dark noise comes from band-to-band tunneling due to high doping in the multiplication region. DCR as a function of excess bias based on devices with different doping levels in the multiplication region is reported in Fig.…”
Section: Characteristics On Flexible Trench-isolated Spad Integrated mentioning
confidence: 70%
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