A fast high-accuracy lattice-parameter comparator

Häusermann, Daniel M.; Hart, Matthew B.

doi:10.1107/s0021889889011623

Cited by 38 publications

(3 citation statements)

References 13 publications

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“…The present discussion of the NIST lattice comparison apparatus is abbreviated, since more detailed description is available in [1]. The crystal geometry is similar to that suggested by Hart [2] and used by Ando et al [3], Becker et al [4], and Häusermann et al [5] to make precision lattice spacing comparisons. However, the NIST lattice spacing comparator has characteristics that enhance its sensitivity, avoid driftrelated systematic errors, and increase the sample throughput.…”

Section: Description Of the Nist Lattice Comparatormentioning

confidence: 99%

Intercomparison of silicon samples from the Avogadro projects

Kessler

Schweppe

Deslattes

1997

IEEE Trans. Instrum. Meas.

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Section: Description Of the Nist Lattice Comparatormentioning

confidence: 99%

Intercomparison of silicon samples from the Avogadro projects

Kessler

Schweppe

Deslattes

1997

IEEE Trans. Instrum. Meas.

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“…This geometry, which is similar to one suggested by Hart [7], is a conventional double-crystal Laue-case spectrometer. Ando et al [8], Becker et al [9], and Hausermann et al, [10] have also used similar geometries (a) to precisely compare lattice spacings. As will emerge in the dif^ussion which follows, the NIST instrument has certain new features which enhance its generality and sensitivity.…”

Section: Principle Of the Measurementmentioning

confidence: 99%

Precision comparison of the lattice parameters of silicon monocrystals

Kessler¹,

Henins²,

Deslattes³

et al. 1994

J. RES. NATL. INST. STAN.

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The lattice spacing comparator estabMshcd MC the National InMitute of Standards and Technology to measure the lattice spacing differences between nearly perfect crystals i^ described in detail, t^tticc spacing differences are inferred from the measured differcrrces in Br3g;g Hngics for different crystals. The comparator is a vna crystal spectrometer uficd in the nearly nondispersive geometry. It has two s-ray sources, two detectors, and a ilevicc which permits rcmiUe interchange of the second crystal sample. .\ sensitive heterodyne interferometer which it calibrated with an optical polygon is used to measure the Bragg an^es. The crystals are manufactured with nearly equal rhicknesscs so that the recorded profiles exhibit pcndclhisung oscillatinifs which permit more precise division of the x-ray profiles. The difference in lattice spacing between silicon •umpks used at Physikalisch-TcchnischcBundcsansiait (PTB) and NIST has been measured with a relittive uncertainty of 1 x I0~*. This measurement Ls consisitcnt with absolute lattice spacing measurements made at PTB and NIST, Components of uncertainty associated with systematic effects due to misaligt^ments arc derived and estimated. Key word.s: Bragg angle; lattice spacing; silicon; x-ray difTraction; x-ray specAccepl«d: October 25. 1993

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“…Differential comparisons down to a few parts in 108 are possible with some methods. Hausermann & Hart (1990) have described a monolithic silicon lattice-parameter comparator, which enables differential measurements on other samples of silicon to be made to this precision in dedicated apparatus. Since the silicon lattice is the most precise and traceable length standard (to 8 parts in 108) in the nanometre regime, use of this as a comparison standard provides absolute measurement and is much more satisfactory than the use of X-ray wavelengths, which are only known to about 1 part in 106.…”

Section: Journal Of Applied Crystallographymentioning

confidence: 99%

A Method for the Accurate Comparison of Lattice Parameters

Bowen¹,

Tanner²

1995

J Appl Cryst

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A new method of comparison of lattice parameters is described. The method uses a standard double-crystal diffractometer, fitted with a specimen rotation stage, which compensates for tilt errors on the specimen setting. Some improvement is possible through the use of a monochromatizing system with a well defined wavelength. The use of a single reference standard enables the instrument zero to be accurately determined; the use of a second reference or a different reflection from the first allows the wavelength to be accurately determined. The errors are carefully assessed and it is shown that some errors important in other methods are self-cancelling through the use of the rotation stage, which need not itself be an ultraprecision component. Peak location to a confidence level of 10" permits absolute traceable latticeparameter determination to a few tens of parts in 10 6, with much greater relative sensitivity. The method is verified using both a tangent-arm-driven and direct-drive double-axis diffractometer at room temperature on samples of semi-insulating gallium arsenide. Comparison of the lattice parameter of a sample using this method and the conventional Bond technique is satisfactory.

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A fast high-accuracy lattice-parameter comparator

Cited by 38 publications

References 13 publications

Intercomparison of silicon samples from the Avogadro projects

Intercomparison of silicon samples from the Avogadro projects

Precision comparison of the lattice parameters of silicon monocrystals

A Method for the Accurate Comparison of Lattice Parameters

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