2020
DOI: 10.1109/tcsii.2020.2999272
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A Dynamic-Biased Resistor-Based CMOS Temperature Sensor With a Duty-Cycle-Modulated Output

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Cited by 15 publications
(4 citation statements)
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“…In Table I [27,28,29,30], the performance of the proposed sensor with some state-of-the-art designs is summarized and compared. Since the adoption of an all-digital architecture, a die area of 1915 µm 2 has been occupied.…”
Section: Measurement Resultsmentioning
confidence: 99%
“…In Table I [27,28,29,30], the performance of the proposed sensor with some state-of-the-art designs is summarized and compared. Since the adoption of an all-digital architecture, a die area of 1915 µm 2 has been occupied.…”
Section: Measurement Resultsmentioning
confidence: 99%
“…where I C is the charging current, t h and t l are the logichigh time and logic-low time respectively. t rst is the time duration for the capacitor to reset, which can be compensated conveniently in the digital domain [11].…”
Section: A Basic Operating Principlementioning
confidence: 99%
“…However, in the case of detecting a wide range of sensor resistance such as chemiresistive gas sensors with dynamic variation up to 5 -6 decades, this method cannot be employed due to its limitation of resistance range coverage [14]. Another strategy for R-V conversion is based on current excitation technique that forces a constant current through the sensor and measures the amplified output voltage [18]- [19], [29]- [31]. In this method, highly accurate and stable current reference sources are required to build the circuitry.…”
Section: Introductionmentioning
confidence: 99%