A Diagnostic Fault Simulation Method for a Single Universal Logical Fault Model

Hosokawa, Toshinori; Takano, Hideyuki; Yamazaki, Hiroshi; Yamazaki, Koji

doi:10.1109/prdc.2017.38

2017 IEEE 22nd Pacific Rim International Symposium on Dependable Computing (PRDC) 2017

DOI: 10.1109/prdc.2017.38

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A Diagnostic Fault Simulation Method for a Single Universal Logical Fault Model

Toshinori Hosokawa

Hideyuki Takano

Hiroshi Yamazaki

et al.

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Cited by 4 publications

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An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information

Ota,

Hosokawa,

Yamazaki

et al. 2023

2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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A Diagnostic Fault Simulation Method for a Single Universal Logical Fault Model

Cited by 4 publications

References 6 publications

An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information

An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information

Quantum Deductive Simulation for Logic Functions

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