An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information

Ota, Natsuki; Hosokawa, Toshinori; Yamazaki, Koji; Yamauchi, Yukari; Arai, Masayuki

doi:10.1109/dft59622.2023.10313540

2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023

DOI: 10.1109/dft59622.2023.10313540

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An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information

Natsuki Ota,

Toshinori Hosokawa,

Koji Yamazaki

et al.

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An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information

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References 14 publications

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