A contribution to the investigation of enamel/metal Interfaces

Abstract

The diffusion processes which influence the adhesion between enamel and metals take place in an -5 pm thick layer at the interface. Electron X-ray microanalysis cannot be used to investigate this zone, except to a limited extent, because its depth and lateral resolution are inadequate. A procedure which permits quantitative determination of Fe in the zone at the interface is described. It is based on X-ray and Auger microanalysis of tapered sections. The Auger intensities are quantified by X-ray microanalysis within sufficiently thick enamel layers.