Angewandte Oberflächenanalyse Mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoe 1986
DOI: 10.1007/978-3-642-70177-1_2
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Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen

H.J. Dudek1
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