Proceedings of the Design Automation &Amp; Test in Europe Conference 2006
DOI: 10.1109/date.2006.244018
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A concurrent testing method for NoC switches

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Cited by 35 publications
(12 citation statements)
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“…It represents that the test cycle of proposed STR is less than the approaches in [3,6,7,10]. Because STR approach supports parallel testing, the test cycle is less than the DfT-based approaches in [6,7,10]. Because our fault model, which described in Sect.…”
Section: Test Cyclementioning
confidence: 96%
See 2 more Smart Citations
“…It represents that the test cycle of proposed STR is less than the approaches in [3,6,7,10]. Because STR approach supports parallel testing, the test cycle is less than the DfT-based approaches in [6,7,10]. Because our fault model, which described in Sect.…”
Section: Test Cyclementioning
confidence: 96%
“…Hosseinabady et al [6] proposed a wrapper with scan-chains attached to each router on OCNs. One of the routers is defined as a test access switch to receive test patterns from the external test source and broadcast these patterns to other routers.…”
Section: Dft-based Solutionsmentioning
confidence: 99%
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“…Built-in-self-test (BIST), a well-known approach to diagnose faults, has been extensively addressed as a post-silicon technique for fault detection during the NoC lifetime [4], [20], [11]. To utilize our recovery mechanisms, the network requires to go periodically into selftest in regular intervals and update ISRs and OSRs.…”
Section: Relinoc Architecturementioning
confidence: 99%
“…1). Detection can be achieved, for instance, with error correcting codes (ECC) [17] or custom NoC testing mechanisms [18], [19]. Next, the system undergoes diagnosis to determine the fault location.…”
mentioning
confidence: 99%