A computer simulation of stripe deterioration through electromigration

Abstract

A computer simulation of stripe deterioration under electromigration is developed with especial regard to the physical aspects of the process. A grain-boundary network is first established appropriate to a {111} grain-boundary texture by a Voronoi process. Stress relief through the motion of network vertices can be used to simulate the effects of annealing. In operation, two different situations are considered: (1) free-surface condition and (2) operation under a passivating surface containment. With the free-surface condition, voids grow internally while the extra material spreads over the surface. With the passivating condition, the matter is conserved and eventually a steady state ensues. The possibility of sideways extrusions or ‘‘spikes’’ is considered. Many other possible applications of the model are indicated.

Dependence of electromigration lifetime on the square of current density

“…al. [28], and the basic features of electromigration for two cases, un-passivated (where surfaces act as sinks) and passivated (without sinks), were pointed out.…”

Theoretical Studies of Electromigration in Polycrystalline Metal Stripes

“…In technology, current-induced conductor failure, known as electromigration, has been modeled by an empirical formula introduced by Black [1]. The underlying physics has been addressed by several authors by atomic-scale theories [2] and by phenomenological models that seek to capture the key processes [3][4][5][6][7].…”