A compendium of recent optocoupler radiation test data

LaBel, Kenneth A.; Kniffin, S.D.; Reed, Robert A.; Kim, H.S.; Wert, J.L.; Oberg, D.L.; Normand, E.; Johnston, A.H.; Lum, G.K.; Koga, R.; Crain, S.; Schwank, J.R.; Hash, G.L.; Büchner, S.; Mann, J.; Simpkins, L.; D'Ordine, M.; Marshall, C.; O'Bryan, Martha V.; Seidleck, C.M.; Nguyen, Loc Xuan; Carts, M.A.; Ladbury, Raymond L.; Howard, J.W.

doi:10.1109/redw.2000.896280

Cited by 28 publications

(7 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Experiments with Co-60 gamma rays showed no measureable effect on the optocouplers. It is therefore assumed that the CTR degradation is due to displacement damage in the Light Emitting Diode (LED) [14]. Parametric failure is taken as the point where the CTR degrades to 0.01.…”

Section: B Device Total Dose Failure Distribution G(x)mentioning

confidence: 99%

Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology

Xapsos

Stauffer²,

Phan³

et al. 2017

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

Section: B Device Total Dose Failure Distribution G(x)mentioning

confidence: 99%

Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology

Xapsos

Stauffer²,

Phan³

et al. 2017

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

“…A high resistance of some HCPL optrons (Avago Technologies) is experimentally con firmed. At the same time, the investigations show an unconformity of actual resistance levels of HSSR optocouplers (Avago Technologies) to levels declared in the official documentation [10][11][12][13]. Moreover, the increased sensitivity of optocouplers to defect for ming actions (protons, neutrons) is shown in publica tions.…”

Section: Galvanic Feedback Signal Decoupling Unitmentioning

confidence: 99%

An analysis of the radiation behavior of pulse voltage stabilizers

2012

View full text Add to dashboard Cite

A typical structure of modern hybrid microcircuits of pulse voltage stabilizers (PVSs) is analyzed. Experiential studies of dose and single event local ionization effects in basic units of modern pulse voltage stabilizers are performed. The model of pulse voltage stabilizers for analyzing single event effects is proposed, and its experimental verification is fulfilled. The most radiation sensitive basic units of pulse voltage stabiliz ers are revealed. Recommendations for increasing their radiation resistance are given.

show abstract

“…3 (usually with protons as the source [3]): 1) total ionizing dose and 2) nonionizing energy loss (NIEL) [4]. Within the fluence range shown in the figure, neither of these is sufficient to explain the output leakage current variation.…”

Section: A Electrical and Radiation Measurementsmentioning

confidence: 99%

14-MeV neutron and Co/sup 60/ gamma testing of a power MOSFET optocoupler

McMarr

Nelson²,

Hughes³

et al. 2003

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

The effect of radiation from neutron activation of package materials was studied using a power MOSFET optocoupler as the test device. The optocouplers were exposed to 14-MeV neutrons to a fluence of 1 10 11 n cm 2 , with the devices switching during exposure. Electrical characterization was performed after each neutron exposure. A separate set of optocouplers was then irradiated using a Co 60 source. These results combined with gamma ray spectroscopy showed that radiation from neutron activation had a significant effect on the electrical parameters of the optocouplers.

show abstract

A compendium of recent optocoupler radiation test data

Abstract: Abstract-Wepresent a compendium of optocoupler radiation test data including neutron, proton and heavy ion Displacement Damage (DD), Single Event Transients (SET) and Total Ionizing Dose (TID).Proton data includes ionizing and non-ionizing damage mechanisms.

Cited by 28 publications

References 11 publications

Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology

Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology

An analysis of the radiation behavior of pulse voltage stabilizers

14-MeV neutron and Co/sup 60/ gamma testing of a power MOSFET optocoupler

Contact Info

Product

Resources

About