1995
DOI: 10.1007/bf02657981
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A comparison of techniques for nondestructive composition measurements in CdZnTe substrates

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Cited by 60 publications
(32 citation statements)
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“…Fig. 1 illustrates the known (see [1,5,9,10,13] [5,10]. They were found by adding the A 0 X exciton binding energy ε bA =16 meV to the measured hν m (A 0 X) vs. x dependences (it is assumed that ε bA ≠ φ(x)).…”
Section: Methodsmentioning
confidence: 99%
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“…Fig. 1 illustrates the known (see [1,5,9,10,13] [5,10]. They were found by adding the A 0 X exciton binding energy ε bA =16 meV to the measured hν m (A 0 X) vs. x dependences (it is assumed that ε bA ≠ φ(x)).…”
Section: Methodsmentioning
confidence: 99%
“…They were found by adding the A 0 X exciton binding energy ε bA =16 meV to the measured hν m (A 0 X) vs. x dependences (it is assumed that ε bA ≠ φ(x)). So, the given in [5,10] band gap E g vs. x dependences were replotted by us into primary dependences hν m (A 0 X) =E g -ε bA vs. x (x ≤ 0.065 -0.07) by taking into account the ε bA value. They are shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
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“…These alloys were already prepared as single crystals grown by the Bridgman method and travelling heater technique [7][8][9][10][11] . ZnxCd1-xTe alloys are the basic elements in the fabrication of the solid-state detectors for medical applications 12 and astronomical physics [13][14] .…”
Section: Introductionmentioning
confidence: 99%