A Comparison of Hot Carrier and 50 MeV Li3+ Ion Induced Degradation in the Electrical Characteristics of Advanced 200 GHz SiGe HBT

Praveen, K. C.; Pushpa, N.; Bharathi, M. N.; Cressler, John D.; Prakash, A. P. Gnana

doi:10.1007/978-3-319-03002-9_27

Physics of Semiconductor Devices

2014

DOI: 10.1007/978-3-319-03002-9_27

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A Comparison of Hot Carrier and 50 MeV Li3+ Ion Induced Degradation in the Electrical Characteristics of Advanced 200 GHz SiGe HBT

K. C. Praveen

N. Pushpa²,

M. N. Bharathi

et al.

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A Comparison of Hot Carrier and 50 MeV Li3+ Ion Induced Degradation in the Electrical Characteristics of Advanced 200 GHz SiGe HBT

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References 7 publications

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