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2002
DOI: 10.1006/spmi.2002.1046
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A comparative study of AlGaAsSb/AlAsSb distributed Bragg mirrors on InP

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Cited by 4 publications
(8 citation statements)
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References 21 publications
(29 reference statements)
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“…Materials belonging to the group III-V antimonide family materials, such as GaAsSb and AlGaAsSb alloys, lattice matched to InP, have been used in the past for heterojunctions structures in electronic and optoelectronic devices in the range of 1.0-2.0 m. [1][2][3][4][5][6][7][8][9][10][11][12] These alloys show compositional inhomogeneity due to phase separation resulting from miscibility gaps. 13,14 Variation in the alloy composition produces fluctuation of the electrostatic potential, affecting excitonic transitions and donor and acceptor recombination.…”
Section: Introductionmentioning
confidence: 99%
“…Materials belonging to the group III-V antimonide family materials, such as GaAsSb and AlGaAsSb alloys, lattice matched to InP, have been used in the past for heterojunctions structures in electronic and optoelectronic devices in the range of 1.0-2.0 m. [1][2][3][4][5][6][7][8][9][10][11][12] These alloys show compositional inhomogeneity due to phase separation resulting from miscibility gaps. 13,14 Variation in the alloy composition produces fluctuation of the electrostatic potential, affecting excitonic transitions and donor and acceptor recombination.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, there has been great interest in the materials belonging to the group of III-V antimonide family such as GaAsSb and AlGaAsSb alloys lattice matched to InP due to its applications in heterojunction structures employed in electronic and optoelectronic devices in the range of 1,0 µm and 2,0 µm [1][2][3][4][5][6][7][8]. As different semiconductor materials [9][10][11], the GaAsSb and AlGaAsSb alloys present fluctuation of the electrostatic potential in the epitaxial layers due to compositional inhomogeneity resulting from miscibility gap [10].…”
Section: Introductionmentioning
confidence: 99%
“…In vertical-cavity surface-emitting layers devices (VC-SELs), a mirror reflectivity exceeding 99% and a low electric perpendicular resistance are required for n-type and p-type Bragg mirrors. The high reflectivity is accomplished by employing high refractive contrast material systems such as AlGaAsSb/AlAsSb [8] and GaAsSb/AlAsSb [23]. However, these systems present a high band discontinuity, which is unfavorable to the current flow through the heterointerfaces [5].…”
Section: Introductionmentioning
confidence: 99%
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“…Analyses employing the photoluminescence technique at the AlGaAsSb gap region as well as current-voltage curves and mirrors reflectivity measurements were performed. An initial study comparing the optical and electrical behavior of Bragg mirrors with digital alloy and homogeneous doping had already been previously performed (TOGINHO FILHO, 2002).…”
mentioning
confidence: 99%