2002
DOI: 10.1016/s0141-6359(02)00121-6
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A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers

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Cited by 73 publications
(42 citation statements)
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“…Fig. 7 shows a schematic of the sensor, which is based on the principle of autocollimation [24][25][26][27][28][29][30]. The p-polarization laser light from a laser diode is collimated to a beam with a diameter of 6 mm.…”
Section: The Fabrication System and The Optical Slope Sensor For The mentioning
confidence: 99%
“…Fig. 7 shows a schematic of the sensor, which is based on the principle of autocollimation [24][25][26][27][28][29][30]. The p-polarization laser light from a laser diode is collimated to a beam with a diameter of 6 mm.…”
Section: The Fabrication System and The Optical Slope Sensor For The mentioning
confidence: 99%
“…The autocollimation unit consists of a lens and a position-sensing photo-detector placed at the focal plane of the lens. Quadrant photodiodes are used as the photo-detectors in the sensor for 2D detection [28,29]. The autocollimation allows for the angle-detection independent from the distance between the sensor unit and the angle grid surface.…”
Section: The Xyθ Z Surface Encodermentioning
confidence: 99%
“…Compared with multi-orientation methods, multiprobe methods are more suitable for on-machine measurements because it does not depend on the repeatability of the spindle error [8][9][10].…”
Section: Introductionmentioning
confidence: 99%