“…Therefore, determining optical constants (refractive coefficient, n, and extinction coefficient, k) of Iridium (IV) Oxide (IrO 2 ) thin films is essential for designing optoelectronical and optical tools for producing optical covers and similar tools such as multilayer covers and filters [15][16][17][18][19][20][21]. The measured experimental parameters including optical reflectivity are used as a function of wavelength to determine optical parameters of thin layers [22][23][24][25][26][27]. For determining optical parameters, various physical models such as Kuschi, Frouhi-Blumber and Tawk-Lorentz have been suggested to calculate refractive coefficient, n, and extinction coefficient, k. for any thin layer, an appropriate optical model should be selected and used for estimation of real and imaginary di-electric function according to its physical condition [28][29][30][31][32][33][34].…”