29th Conference on Precision Electromagnetic Measurements (CPEM 2014) 2014
DOI: 10.1109/cpem.2014.6898399
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A broadband electromagnetic characterization of Ba<inf>0.7</inf>Sr<inf>0.3</inf>TiO<inf>3</inf> thin films on coplanar waveguide up to microwave frequencies

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Cited by 2 publications
(5 citation statements)
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“…Thus, a large dielectric tunability and low dielectric loss tangent were simultaneously achieved in these films. Moreover, various reports on strain-engineered BST thin films have been documented in the literature but no clear distinctions between intrinsic and extrinsic contributions to the measured dielectric properties have been made [43][44][45][46][47][48][49][50][51][52]. The approaches have included fabrication on different substrates [43], different film thicknesses [44], different orientation of crystalline substrates [44][45][46][47], different buffer layers on Si substrates [48,49], and platinized Si substrates [50].…”
Section: Engineering Of Permittivity By Homogenous Strain In Perovksi...mentioning
confidence: 99%
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“…Thus, a large dielectric tunability and low dielectric loss tangent were simultaneously achieved in these films. Moreover, various reports on strain-engineered BST thin films have been documented in the literature but no clear distinctions between intrinsic and extrinsic contributions to the measured dielectric properties have been made [43][44][45][46][47][48][49][50][51][52]. The approaches have included fabrication on different substrates [43], different film thicknesses [44], different orientation of crystalline substrates [44][45][46][47], different buffer layers on Si substrates [48,49], and platinized Si substrates [50].…”
Section: Engineering Of Permittivity By Homogenous Strain In Perovksi...mentioning
confidence: 99%
“…Moreover, various reports on strain-engineered BST thin films have been documented in the literature but no clear distinctions between intrinsic and extrinsic contributions to the measured dielectric properties have been made [43][44][45][46][47][48][49][50][51][52]. The approaches have included fabrication on different substrates [43], different film thicknesses [44], different orientation of crystalline substrates [44][45][46][47], different buffer layers on Si substrates [48,49], and platinized Si substrates [50]. Campbell et al fabricated a series of nanostructured ferroelectric thin films of BST-0.6 on LAO substrates using a pulsed laser deposition system with real-time, in situ process control [51].…”
Section: Engineering Of Permittivity By Homogenous Strain In Perovksi...mentioning
confidence: 99%
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“…Plusieurs méthodes de mesures ont ainsi été développées afin d'extraire les caractéristiques électromagnétiques de matériaux jusqu'au terahertz. On distingue ainsi des techniques résonnantes [1], en espace libre [2], capacitives [3], en lignes de transmission [4] et en spectroscopie terahertz [5]. La méthode présentée dans cette étude utilise une topologie en ligne de transmission coaxiale classique dans le but de réaliser un kit de mesure métrologique étalon pour la caractérisation électromagnétique de matériaux diélectriques et/ou magnétiques jusqu'à 18 GHz.…”
Section: Introductionunclassified