2011
DOI: 10.4236/jemaa.2011.38050
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A Broadband Complex Permittivity Probe Using Stepped Coaxial Line

Abstract: This paper proposes the stepped coaxial line sensor using the reflection coefficient in microwave range for complex permittivity measuring. The proposed probe is adapted from the conventional SMA connector which is cheap and easy to fabricate. The analysis model of the probe has been done by using FDTD method with the reference material such as the distilled water. The stepped SMA probe presents the accurate result compared with the convention one. The permittivity values of the concentrated alcohols of 10%, 1… Show more

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Cited by 11 publications
(7 citation statements)
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“…Measurements of the dielectric constant (Dk) and loss tangent (Tan δ) are conducted. The probe test is indicated as one of the most popular and easy to use methods to obtain the dielectric properties [ 40 , 41 , 42 ], and it is considered as a non-destructive test that doesn’t affect the measuring substrate with a probe method measurement capability of up to 20 GHz [ 43 ].…”
Section: Homogenous Phantom Development and Measurementmentioning
confidence: 99%
“…Measurements of the dielectric constant (Dk) and loss tangent (Tan δ) are conducted. The probe test is indicated as one of the most popular and easy to use methods to obtain the dielectric properties [ 40 , 41 , 42 ], and it is considered as a non-destructive test that doesn’t affect the measuring substrate with a probe method measurement capability of up to 20 GHz [ 43 ].…”
Section: Homogenous Phantom Development and Measurementmentioning
confidence: 99%
“…In the first model, a coaxial probe terminated in layered dielectric materials of finite thickness. (12)(13)(14)(15) Here, the sample of the dielectric material is backed by either free space or a finite metal sheet as seen in Fig. 1.…”
Section: Overview Of Dielectric Constant Characterization Techniquesmentioning
confidence: 99%
“…[26]- [27]- [28] Distilled water is usually used to be the material standard because of its known complex permittivity. [29] The Roberts and von Hippel method requires measurement to determine the standing wave-ratios (SWR's) in the line with and without the sample inserted. From the shift of the standing-wave node and changes in node widths related to SWR's, sample length, and waveguide dimensions, etc.…”
Section: Sample Preparationmentioning
confidence: 99%