A BIST scheme for an SNR test of a sigma-delta ADC

A multi-converter DFT technique for complex SIP: Concepts and validation

“…To overcome these problems, several authors have proposed different BIST techniques where signals are internally generated and/or analysed [1][2][3][4][5][6][7]. Another possible and less expensive solution consists in using DFT techniques to internally transform the analogue signals into digital signals that are made controllable and observable from the chip I/Os [3,8,9].…”

“…Considering for instance the test of a single ADC using accurate instruments, it has been demonstrated [10] that the output signal can be represented by (1). This equation includes an ideal sampled sine wave x(n) and the sum of all the harmonic values introduced by the converter errors.…”

BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits

“…The proposed DLPM method is evaluated on an analog to digital converter (ADC) as the appropriate representative. Although several attempts [1][2][3][4][5][6][7][8] have been made to alleviate increasing test difficulties of ADC testing, none of these methods provides the possibilities for early identification of excessive process parameter variations. In [1], the on-chip delta-sigma DAC for sine wave generation and DSP techniques for data analysis are utilized.…”

A design for testability study on a high performance automatic gain control circuit

“…The HBIST concept 26 includes an onchip TSG that converts digital test patterns to a test stimulus, and is realised by the reconfiguration of cells already present to perform the digital BIST. Other concepts suitable for mixed signal circuits where the digital kernel is surrounded with analogue sub-circuits on the input and output, are the MADBIST concept for Σ∆ converters 27,28,29 and the BIST for the converters on a single-chip CODEC 30 . The OBIST technique 31 , suitable for both functional and defect oriented testing, is based on the oscillation test methodology.…”