A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks

So, Hon Yiu; Ling, Man Ho

doi:10.1109/tr.2015.2440235

Cited by 18 publications

(4 citation statements)

References 17 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The maximum likelihood estimator (MLE) of θ, denoted by θ, is obtained by maximizing the likelihood function in (1) or, equivalently, its logarithm.…”

Section: Definition 1 (Mle Classical Definition)mentioning

confidence: 99%

See 1 more Smart Citation

Power divergence approach for one-shot device testing under competing risks

Castilla

Martín

2023

Journal of Computational and Applied Mathematics

View full text Add to dashboard Cite

“…The maximum likelihood estimator (MLE) of θ, denoted by θ, is obtained by maximizing the likelihood function in (1) or, equivalently, its logarithm.…”

Section: Definition 1 (Mle Classical Definition)mentioning

confidence: 99%

“…Crowder (2001) has presented review of this competing risks problem for which one needs to estimate the failure rates for each cause. Balakrishnan et al (2016aBalakrishnan et al ( , 2016b and So (2016) have discussed the problem of one-shot devices under competing risk for the first time.…”

Section: Introductionmentioning

confidence: 99%

Power divergence approach for one-shot device testing under competing risks

Castilla

Martín

2023

Journal of Computational and Applied Mathematics

View full text Add to dashboard Cite

“…Balakrishnan, Ling, and So [10] provided some popular reliability models for analyzing one-shot device testing data collected from constant-stress accelerated life tests. Analysis of one-shot device testing data has been recently received a great attention in reliability engineering [4][5][6][7][11][12][13]24]. However, the previously published papers considered constant-stress accelerated life tests for one-shot devices.…”

Section: Introductionmentioning

confidence: 99%

Optimal Design of Simple Step-Stress Accelerated Life Tests for One-Shot Devices Under Exponential Distributions

Ling¹

2018

Prob. Eng. Inf. Sci.

Self Cite

View full text Add to dashboard Cite

This paper considers simple step-stress accelerated life tests (SSALTs) for one-shot devices. The one-shot device is an item that cannot be used again after the test, for instance, munitions, rockets, and automobile air-bags. Either left-or right-censored data are collected instead of actual lifetimes of the devices under test. An expectation-maximization algorithm is developed here to find the maximum likelihood estimates of the model parameters based on one-shot device testing data collected from simple SSALTs. Furthermore, the asymptotic variance of the mean lifetime under normal operating conditions is determined under the expectation-maximization framework. On the other hand, the optimal design that minimizes the asymptotic variance of the estimate of the mean lifetime under normal operating conditions in terms of three decision variables, including stress levels, inspection times, and sample allocation is discussed. A procedure then is presented to determine the decision variables when a range of stress levels and the termination time of the test as well as normal operating conditions of the devices are given. The properties of the optimal design and the effects of errors in pre-specified planning values of the model parameters are also investigated. Comprehensive simulation studies show that the procedure is quite reliable for the design of simple SSALTs.

show abstract

“…Balakrishnan et al [7,8] studied estimation of different lifetime distributions in presence of competing risks. Balakrishnan et al [9] provided Bayesian inference under competing risk setup. Wang et al [35] studied competing risk failure time data for a frailty-copula model.…”

mentioning

confidence: 99%

Robust estimation of dependent competing risk model under interval monitoring and determining optimal inspection intervals

Mondal¹,

Baghel²

2022

Preprint

View full text Add to dashboard Cite

Recently, a growing amount interest is quite evident in modelling dependent competing risks in life time prognosis problem. In this work, we propose to model the dependent competing risks by Marshal-Olkin bivariate exponential distribution. The observable data consists of number of failures due to different causes across different time intervals. The failure count data is common in instances like one shot devices where state of the subjects are inspected at different inspection times rather than the exact failure times. The point estimation of the life time distribution in presence of competing risk has been studied through divergence based robust estimation method called minimum density power divergence estimation (MDPDE). The testing of hypothesis is performed based on a Wald type test statistic. The influence function is derived both for the point estimator and the test statistic, which reflects the degree of robustness. Another, key contribution of this work is to determine the optimal set of inspection times based on some predefined objectives. This article presents determination of multi criteria based optimal design. Population based heuristic algorithm non-dominated sorting-based multiobjective Genetic algorithm is exploited to solve this optimization problem.

show abstract

A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks

Cited by 18 publications

References 17 publications

Power divergence approach for one-shot device testing under competing risks

Power divergence approach for one-shot device testing under competing risks

Optimal Design of Simple Step-Stress Accelerated Life Tests for One-Shot Devices Under Exponential Distributions

Robust estimation of dependent competing risk model under interval monitoring and determining optimal inspection intervals

Contact Info

Product

Resources

About