2019 IEEE 19th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) 2019
DOI: 10.1109/sirf.2019.8709096
|View full text |Cite
|
Sign up to set email alerts
|

A 48 dBm peak power RF switch in SOI process for 5G mMIMO applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
4
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 8 publications
(5 citation statements)
references
References 1 publication
0
4
0
Order By: Relevance
“…Table III compares the electrical performance of high power switches designed by stacked FETs technology. Compared with the work in [30], this work shows close insertion loss and better P-0.1dB. Besides, this work does not require negative voltage to provide sufficient supply voltage difference, which is more space-saving for the terminal applications.…”
Section: Experiments Resultsmentioning
confidence: 93%
“…Table III compares the electrical performance of high power switches designed by stacked FETs technology. Compared with the work in [30], this work shows close insertion loss and better P-0.1dB. Besides, this work does not require negative voltage to provide sufficient supply voltage difference, which is more space-saving for the terminal applications.…”
Section: Experiments Resultsmentioning
confidence: 93%
“…As shown in Fig. 1(a), the conventional structure has been used a floating gate/body [4], negative biasing [5], and stacked-FET [6], [7], [8]. However, to handle a high-power while using conventional structure, these techniques use large value gate resistors (R G ) and common gate resistor (R GC ).…”
Section: Design Concept a Switching Time Analysis Of Typical High-pow...mentioning
confidence: 99%
“…For the case of the CMOS SOI switch with a single-branch structure based on multi-stacked FET, it has the advantage of improving the power handling capability compared to that of the two cases mentioned above, due to the mitigated drain-source voltage (V ds.Mn ) of the single-FET, as shown in Figure 2 [4][5][6][7]. If the shunt branch is in the off-state condition, single-FETs are considered to be a simple capacitive equivalent circuit composed of symmetrical parasitic capacitances ('C gs ≈ C gd ' and 'C bs ≈ C bd ') between each node because of the symmetrical drain-source structure and floating gate/body condition, which is implemented by the gate/body resistors (R G , R B , R GC , R BC ) of tens of kilo-ohm or more (see Figure 2).…”
Section: Power Handling Capability and Linearity Of The Tunermentioning
confidence: 99%