2007 IEEE International Electron Devices Meeting 2007
DOI: 10.1109/iedm.2007.4418914
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A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging

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Cited by 579 publications
(272 citation statements)
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“…The device is then covered by atomic layer deposition of 30 nm HfO 2 , a high-κ material commonly used as a gate dielectric. 30,31 Finally, local top gates are deposited in the final round of e-beam lithography and metal deposition, resulting in an integrated circuit such as the one shown in Figure 2b, composed of two single-layer transistors connected in series. The channel width of the transistors in our integrated circuit is 4.2 μm, lead spacing is 1.6 μm, and top gate length is 1.3 μm.…”
mentioning
confidence: 99%
“…The device is then covered by atomic layer deposition of 30 nm HfO 2 , a high-κ material commonly used as a gate dielectric. 30,31 Finally, local top gates are deposited in the final round of e-beam lithography and metal deposition, resulting in an integrated circuit such as the one shown in Figure 2b, composed of two single-layer transistors connected in series. The channel width of the transistors in our integrated circuit is 4.2 μm, lead spacing is 1.6 μm, and top gate length is 1.3 μm.…”
mentioning
confidence: 99%
“…1 A few hindrances exist, however, including the poor quality of the native surface oxide GeO 2 2 and the difficulty in obtaining high-enough n-type carrier concentrations for ultra-shallow junctions. 3 While the insulation issue has essentially been resolved by introducing high-j dielectrics as a replacement for SiO 2 a decade ago 4 (directly applicable to Ge), the doping limitations are still to be overcome. Hence, it is imperative to have more profound knowledge on the formation of defects and their role in the carrier compensation of Ge.…”
mentioning
confidence: 99%
“…Without new inventions, MOSFET scaling and Moore's Law were threatened with the likelihood of coming to an end. Intel's 45nm logic technology was the first to introduce high-K dielectric with metal-gate transistors for improved performance and reduced leakage [8,9]. Gate-oxide equivalent oxide thickness (EOT) is scaled to 0.9nm and transistor gate pitch is scaled to 112.5nm.…”
Section: Introductionmentioning
confidence: 99%