A 217.6–227-GHz CMOS Signal Generator with Injection Locking Technique

Abstract

This paper proposes a 217.6–227-GHz signal generator with injection locking technique in 65-nm CMOS process. The injection locking technique is exploited to synchronize the phases of the two individual voltage control oscillators (VCOs) and improve the output power. The phase noise of the proposed signal generator is improved. The full-layout electromagnetic (EM) simulation in collaboration with the post-layout simulation is utilized to verify the proposed signal generator. The simulation results show that the frequency tuning range is 9.4[Formula: see text]GHz, and the output power is larger than [Formula: see text]14.25[Formula: see text]dBm. The phase noise at 1[Formula: see text]MHz off the carrier is better than [Formula: see text]92.12[Formula: see text]dBc/Hz. The signal generator occupies a compact silicon area of 0.23[Formula: see text]mm2 including all testing pads.