2011 IEEE International Symposium of Circuits and Systems (ISCAS) 2011
DOI: 10.1109/iscas.2011.5937503
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A 1.85fW/bit ultra low leakage 10T SRAM with speed compensation scheme

Abstract: A low leakage memory is an indispensable part of any sensor application that spends significant time in standby (sleep) mode. Although using high V th (HVT) devices is the most straightforward way to reduce leakage, it also limits operation speed during active mode. In this paper, a low leakage 10T SRAM cell, which compensates for operation speed using a readily available secondary supply, is proposed in a 0.18µm CMOS process. It achieves the lowest-to-date leakage power consumption and achieves robust operati… Show more

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Cited by 26 publications
(9 citation statements)
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References 9 publications
(13 reference statements)
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“…The low power techniques utilized are ultra high threshold voltage and thick gate oxide to keep the leakage power low in the capacitance to digital converter. The SRAM is a 10T cell that uses gate length biasing in the dataretaining portion while power gating the read buffer to acheive 2.4 fW/bit standby leakage [71]. The V DD is scaled down close to the minimum energy point so the micro processor and SRAM consume only 90 nW combined at 0.45 V in active mode.…”
Section: Solar Energymentioning
confidence: 99%
“…The low power techniques utilized are ultra high threshold voltage and thick gate oxide to keep the leakage power low in the capacitance to digital converter. The SRAM is a 10T cell that uses gate length biasing in the dataretaining portion while power gating the read buffer to acheive 2.4 fW/bit standby leakage [71]. The V DD is scaled down close to the minimum energy point so the micro processor and SRAM consume only 90 nW combined at 0.45 V in active mode.…”
Section: Solar Energymentioning
confidence: 99%
“…The robustness to terrestrial radiation being a strong requirement for targeted medical applications, it can be achieved by using error correcting codes which rely on the fact that a radiation impact does not flips more than 2 bits within a word. This governed the choice of by-8 multiplexer while the bitcells in [3] and [6] do not allow such multiplexing.…”
Section: A Sram Peripherymentioning
confidence: 99%
“…Several ULV memories have been reported in recent years to offer ULV design ability, however the bitcell reported in [3], [4] cannot be interleaved and suffer from intrinsic Radiation induced Soft Error Rate reliability weakness, further explained. The bitcell reported in [5] needs voltage footer supply modulation which adds design complexity, similarly, the design reported in [6] needs an assistance extra supply and does not withstand interleaving. Thus we believe there is a need for a ULV SRAM working around these limitations to enable industrial ULV applications with single supply and SER correction capability.…”
Section: Introductionmentioning
confidence: 99%
“…This situation becomes a major challenge to reduce the leakage current as we have no option but to keep the circuit ON. To overcome the limitations mentioned above, the proposed SRAM cell has been equipped with a different read process which limits the time required to read the cell and helps in prohibiting the data corruption of cell by isolating it from the external read circuitry [6]. The cell has been designed to work with lower supply voltages, which helps in further reduction of the leakage power thus making the cell more efficient.…”
Section: Introductionmentioning
confidence: 99%