2018 IEEE Asian Solid-State Circuits Conference (A-Sscc) 2018
DOI: 10.1109/asscc.2018.8579290
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A 0.6-to-1V 10k-to-100kHz BW 11.7b-ENOB Noise-Shaping SAR ADC for IoT sensor applications in 28-nm CMOS

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Cited by 18 publications
(9 citation statements)
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“…The mismatch in the CDAC can affect the ADC linearity, and the DEM technique can be used to address the issue [ 9 , 10 , 19 ]. Either random or cyclic selection can realize the DEM.…”
Section: Measured Resultsmentioning
confidence: 99%
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“…The mismatch in the CDAC can affect the ADC linearity, and the DEM technique can be used to address the issue [ 9 , 10 , 19 ]. Either random or cyclic selection can realize the DEM.…”
Section: Measured Resultsmentioning
confidence: 99%
“…Therefore, direct comparison is difficult. The DEM technique addresses the mismatch problem [ 9 , 19 ]. These works show slightly better FOM S than ours, while our work achieves better FOM W .…”
Section: Measured Resultsmentioning
confidence: 99%
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“…As another solution for low-voltage operation, a noise-shaping (NS) successive approximation register (SAR) ADC is proposed in reference [73]. The NS SAR ADC is a cascade of integrators feedforward (CIFF) structure ADC, and includes a 2nd order passive loop filter, dynamic element matching (DEM) for 3bit MSB, and digital error correction (DEC) for digital output.…”
Section: Noise-shaping Sar Adc With Passive Filtermentioning
confidence: 99%