Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2005
2005
2009
2009

Publication Types

Select...
1
1
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 6 publications
0
1
0
Order By: Relevance
“…New advantages in surface controls based on SPM technique and Atomic Force Microscopy (AFM), have been involved in the last few years to serve rarefied gas dynamics purposes and now are used for gathering information on a wide range of surface structure parameters from an atomic to macroscopic scale. We have applied this experimental approach recently, together with our Italian partners for the INTAS project (University of Genoa group), for studying structural change in Si single crystal samples exposed to a gas atmosphere [14]. Now we are attempting to use it for studying surface degradation of Si-based Thermal Protection Materials (TPM) as a result of plasma exposure.…”
Section: Bmentioning
confidence: 99%
“…New advantages in surface controls based on SPM technique and Atomic Force Microscopy (AFM), have been involved in the last few years to serve rarefied gas dynamics purposes and now are used for gathering information on a wide range of surface structure parameters from an atomic to macroscopic scale. We have applied this experimental approach recently, together with our Italian partners for the INTAS project (University of Genoa group), for studying structural change in Si single crystal samples exposed to a gas atmosphere [14]. Now we are attempting to use it for studying surface degradation of Si-based Thermal Protection Materials (TPM) as a result of plasma exposure.…”
Section: Bmentioning
confidence: 99%