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McDermott, Kevin J.; Yao, Wenlong Albert

doi:10.1023/a:1007921129376

Cited by 11 publications

(1 citation statement)

References 2 publications

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“…It has formed the backbone of a country's wealth and power. The industrial sector has emerged from steam engines to programmable logic controllers (PLC) [1]. The reason for these developments is the need for ultimate technological outgrowth.…”

Section: Introductionmentioning

confidence: 99%

Atomic and Close-to-Atomic Scale Manufacturing: A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy

Mathew

Rodriguez

2020

Nanomanuf Metrol

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Manufacturing at the atomic scale is the next generation of the industrial revolution. Atomic and close-to-atomic scale manufacturing (ACSM) helps to achieve this. Atomic force microscopy (AFM) is a promising method for this purpose since an instrument to machine at this small scale has not yet been developed. As the need for increasing the number of electronic components inside an integrated circuit chip is emerging in the present-day scenario, methods should be adopted to reduce the size of connections inside the chip. This can be achieved using molecules. However, connecting molecules with the electrodes and then to the external world is challenging. Foundations must be laid to make this possible for the future. Atomic layer removal, down to one atom, can be employed for this purpose. Presently, theoretical works are being performed extensively to study the interactions happening at the molecule–electrode junction, and how electronic transport is affected by the functionality and robustness of the system. These theoretical studies can be verified experimentally only if nano electrodes are fabricated. Silicon is widely used in the semiconductor industry to fabricate electronic components. Likewise, carbon-based materials such as highly oriented pyrolytic graphite, gold, and silicon carbide find applications in the electronic device manufacturing sector. Hence, ACSM of these materials should be developed intensively. This paper presents a review on the state-of-the-art research performed on material removal at the atomic scale by electrochemical and mechanical methods of the mentioned materials using AFM and provides a roadmap to achieve effective mass production of these devices.

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Section: Introductionmentioning

confidence: 99%

Atomic and Close-to-Atomic Scale Manufacturing: A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy

Mathew

Rodriguez

2020

Nanomanuf Metrol

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Design and implementation of Web-based diagnosis and management system for an FMS

Yao

2004

Int J Adv Manuf Technol

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Given the rise in competition within the global marketplace, the paradigm for manufacturing has changed dramatically. While downstream activities have become the focal point for global competitors, manufacturing remains at the root of a firm's competitive edge. To remain competitive, firms are progressively shifting their manufacturing operations to overseas markets. Foreign markets offer a host of advantages to manufacturers but one of the obvious key advantages is cheaper labor. Even in industries where the required labor-to-capital input ratio is relatively low within the production process, lower labor costs allow the production of more competitively priced products. The emergence of this paradigm, however, has led to a number of managerial problems. Operating a manufacturing facility overseas creates difficulties for management both in the area of personnel and resource allocation. In this project we developed a Web-based remote control platform using digital cameras, a PLC controller and a PC-based Visual Basic human-machine interface (HMI) to create a flexible manufacturing system (FMS). An FMS can be easily controlled and monitored through an Internet-based PLC-control system using a PC-based HMI platform. From remote locations, this platform enables management to effectively monitor, control and diagnose a manufacturing process via the Internet.

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A review of some issues and identification of some barriers in the implementation of FMS

Raj

Shankar

Suhaib

2007

Int J Flex Manuf Syst

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Global competition, advancements in technology and ever changing customers' demand have made the manufacturing companies to realize the importance of flexible manufacturing systems (FMS). These organizations are looking at FMS as a viable alternative to enhance their competitive edge. But, implementation of this universally accepted and challenging technology is not an easy task. A large number of articles have been reviewed and it is found that the existing literature lacks in providing a clear picture about the implementation of FMS. In this paper, work of various researchers has been studied and it is found that it is really a very difficult task for any organization to transform into FMS on the basis of existing research results. A wide gap exists between the proposed approaches/algorithms for the design of different components of FMS and the real-life complexities. Besides describing the gap in various issues related to FMS, some barriers, which inhibit the adaptation and implementation of

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Cited by 11 publications

References 2 publications

Atomic and Close-to-Atomic Scale Manufacturing: A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy

Atomic and Close-to-Atomic Scale Manufacturing: A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy

Design and implementation of Web-based diagnosis and management system for an FMS

A review of some issues and identification of some barriers in the implementation of FMS

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