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Cited by 10 publications
(12 citation statements)
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“…The hardness of the copper deposit is found to increase with increase of duty cycle. 37 A maximum hardness value is obtained at 80% duty cycle at low frequencies (10 and 25 Hz) and at 40% duty cycle at high frequencies (75 and 100 Hz) at constant current density of current density of 2 A dm 22 . Because in a low pulse duty cycle a higher peak current is passed, this produces powdery or burnt deposits with poor adhesion and considerable porosity.…”
Section: Resultsmentioning
confidence: 92%
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“…The hardness of the copper deposit is found to increase with increase of duty cycle. 37 A maximum hardness value is obtained at 80% duty cycle at low frequencies (10 and 25 Hz) and at 40% duty cycle at high frequencies (75 and 100 Hz) at constant current density of current density of 2 A dm 22 . Because in a low pulse duty cycle a higher peak current is passed, this produces powdery or burnt deposits with poor adhesion and considerable porosity.…”
Section: Resultsmentioning
confidence: 92%
“…At higher duty cycles the effect is pronounced and hence lower current density is observed. Maximum increase in current efficiency has been observed at 80% duty cycle for the low frequency pulse plating and at 40% duty cycle for the high frequency pulse plating at the average current density of 2 A dm 22 . Increase in current efficiency must be due to the preferential reduction of an adsorbed monolayer of Cu 2z with pulses of charges equivalent to the reduction of this monolayer.…”
Section: Influence On Current Efficiencymentioning
confidence: 91%
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“…An extensive amount of work has appeared in the literature examining the effect of plating solution modifiers on the physical and chemical characteristics of electrochemically deposited Cu films [25][26][27][28][29][30][31][32][33][34][35]. Depositing Cu films with the in-plane potential gradient technique extends the information obtained from a typical deposition experiment by offering the unique possibility of examining not only the morphology of the film as a whole but also that of the resulting CujAu interfacial region.…”
Section: Effect Of Modifiers and Varying Electrode Geometrymentioning
confidence: 99%