1990
DOI: 10.1109/55.61782
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75-GHz f/sub T/ SiGe-base heterojunction bipolar transistors

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Cited by 470 publications
(67 citation statements)
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“…First, adjustments in the composition of the alloy enable the band structure and mobility to be easily modified [4]. Second, since Si and Ge are isovalent materials with lattice constants differing by B4%, a miscible alloy of the Si and Ge can be crystallized into a diamond lattice structure.…”
Section: Introductionmentioning
confidence: 99%
“…First, adjustments in the composition of the alloy enable the band structure and mobility to be easily modified [4]. Second, since Si and Ge are isovalent materials with lattice constants differing by B4%, a miscible alloy of the Si and Ge can be crystallized into a diamond lattice structure.…”
Section: Introductionmentioning
confidence: 99%
“…Their usage has been demonstrated in high performance bipolar devices and a wide variety of novel electronic devices. 1,2 One way of forming the heterostructures is solid phase epitaxy in which an amorphous film of Si 1Ϫx Ge x on Si is recrystallized.…”
Section: Introductionmentioning
confidence: 99%
“…Development of SiGe HBT technology has progressed very rapidly, and is being actively pursued by a number of groups around the world [ll-231. Highlights from the evolution of SiGe HBT technology include: the first demonstration of a SiGe HBT in 1987 [Ill, the announcement of a 75 GHz f, non-self-aligned SiGe HBT in 1990 [12], and the report of a full SiGe ECL-BiCMOS technology which integrated 60 GHz f, , SiGe HBTs with state-ofthe-art 0.25 pm CMOS in 1992 [13]. In 1993, effort was aimed at exploiting the unique capabilities of SiGe HBT technology for very-high-performance analog applications, resulting in the demonstxation of a 1.0 GS/sec 12-bit digital-to-analog converter 1141.…”
Section: Introductionmentioning
confidence: 99%