2006 IEEE MTT-S International Microwave Symposium Digest 2006
DOI: 10.1109/mwsym.2006.249810
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65 nm RFCMOS technologies with bulk and HR SOI substrate for millimeter wave passives and circuits characterized up to 220 GHZ

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Cited by 30 publications
(10 citation statements)
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“…However, due to technology evolution and continuous decrease of the SiO 2 layer thickness, the signal line of the microstrip transmission lines has to be reduced in order to address 50 transmission lines, leading to an increase of the metallic losses. In (Gianesello et al, 2006), integrated transmission lines showing attenuation losses of 0.9 dB/mm at 10 GHz, and 3 dB/mm at 60 GHz have been demonstrated. However, highimpedance transmission lines can not be realized due to a drastic increase of the attenuation loss, and no efficient miniaturization way has been identified.…”
Section: State Of the Artmentioning
confidence: 99%
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“…However, due to technology evolution and continuous decrease of the SiO 2 layer thickness, the signal line of the microstrip transmission lines has to be reduced in order to address 50 transmission lines, leading to an increase of the metallic losses. In (Gianesello et al, 2006), integrated transmission lines showing attenuation losses of 0.9 dB/mm at 10 GHz, and 3 dB/mm at 60 GHz have been demonstrated. However, highimpedance transmission lines can not be realized due to a drastic increase of the attenuation loss, and no efficient miniaturization way has been identified.…”
Section: State Of the Artmentioning
confidence: 99%
“…Attenuation loss of 2 dB/mm have been reported on conventional CPW transmission lines on silicon substrates fabricated through commercial CMOS foundries (Milanovic et al, 1998). Lower losses can be achieved (0.2 dB/mm and 0.6 dB/mm at 20 GHz and 60 GHz, respectively) by the use of a high-cost SOI CMOS technology using a high resistivity substrate (Gianesello et al, 2006). Besides, CPW quarter-wave transmission lines will result in relatively large occupying areas, depending of the working frequency on silicon substrates.…”
Section: State Of the Artmentioning
confidence: 99%
“…The Power amplifier illustrated in this paper was designed with a 65nm CMOS on bulk (resistivity ρ=20mΩ.cm) from STMicroelectronics [7]. Low power (LP) transistors were chosen as active devices.…”
Section: Cmos Technologymentioning
confidence: 99%
“…3) and TL which do not (microstrip with ground plane as shield not presented here). Since microstrip TLs have demonstrated to have worse performances than CPW in advanced standard digital silicon BEOL with HR substrate [11] we have here focused our attention on CPW achieved on HR SOI. Since it has been demonstrated that in HR SOI substrate losses are drastically reduced, we propose here the use of a new stacked CPW TL dedicated to HR SOI technology.…”
Section: Nm Mosfet Performancesmentioning
confidence: 99%