2013
DOI: 10.1109/led.2013.2272649
|View full text |Cite
|
Sign up to set email alerts
|

500$^{\circ}{\rm C}$ Bipolar Integrated OR/NOR Gate in 4H-SiC

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

4
69
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
4
2

Relationship

1
5

Authors

Journals

citations
Cited by 85 publications
(73 citation statements)
references
References 12 publications
4
69
0
Order By: Relevance
“…For both gates the delay-power consumption product monotonically increases in the range 27 -600 °C: from 90 to 150 nJ and from 100 to 220 nJ for v1 and v2, respectively. Such values are similar to those reported in [3] for the same technology. The lower propagation delay and higher power consumption of v1 can be related to the lower resistance values selected for some of the resistors.…”
Section: Resultssupporting
confidence: 90%
See 4 more Smart Citations
“…For both gates the delay-power consumption product monotonically increases in the range 27 -600 °C: from 90 to 150 nJ and from 100 to 220 nJ for v1 and v2, respectively. Such values are similar to those reported in [3] for the same technology. The lower propagation delay and higher power consumption of v1 can be related to the lower resistance values selected for some of the resistors.…”
Section: Resultssupporting
confidence: 90%
“…In the range 27 -600 °C the transistor current gain shows a non-monotonous behavior with a minimum around 400 °C ( fig. 3), similarly to what has been previously reported for this technology [3] and predicted by simulation [7]. In the same temperature range the collector resistance, following the variations of the collector layer sheet resistance, exhibits a minimum at ~200 °C similarly to [3].…”
Section: Resultssupporting
confidence: 86%
See 3 more Smart Citations